J-ZDM Upright Metallurgical Microscope

Product details

Adopt UIS High-resolution, Long working distance, and infinity light path correcting system objective imaging technology Extending the multiplexing technology of objective, compatible infinity objective with all the observation methods. including bright dark field observation, polarization and also provide with high clear and sharp image in each observation method. Aspherical surface Kohler illumination, increasing the viewing brightness. The Nosepiece can be equipped with detachable DIC differential interference device.

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